May 2011 Newsletter
New Speakers added!
This years Workshop and Conference being held in Montreal Canada, promises to be an informative and educational event. Speakers from across the world will be presenting provocative information that affects our industry, metrology.
Speakers
Dr. Greg Hetland
  International Institute of GD&T
Workshop overview of ASME Y14.5-2009.
   
Dr. Steve Phillips
  National Institute for Standards and Technology (NIST) Dimensional Metrology Measurement Uncertainty Workshop.
   
Dr. Mike McCarthy
  NPL Centre for Freeform Measurement & Analysis,
National Physical Laboratory (UK)

Development of freeform verification artefacts for optical based co-ordinate measuring systems.
   
Mr. Brian Parry
  The Boeing Company
How a measurement uncertainty statement can be used for product development, rather than just end item inspection of aerospace parts.
   
Dr. Frank Haertig
  PTB—Physikalisch-Technische Bundesanstalt (Germany) Evaluating Traceable Microparts on CT Devices – illustrating new application of micro gears.
   
Stelian George-Cosh
Conestoga Institute of Technology, Canada
NACMA—CMM Certification
   
J.-Angelo Beraldin
  Benjamin Carrier, David MacKinnon, Luc Cournoyer, NRC, Canada
NRCC portable target case for short-range 3-D imaging systems characterization.
   
Dr. Jim Salsbury
Mitutoyo America
The GD&T Measurement Conundrum.
   
Mr. Mike Fletcher
Medtronic
Impact of Measurement Uncertainty on Development and Manufacturing.
   
Dr. Kim D. Summerhays
MetroSage LLC
Applications of Computer Simulation in Coordinate Measuring Machine Uncertainty Evaluation.
   

Visit the Event information page
Attendee information
Attendee registration form
Registration and payment summary

Who should attend?
The workshop is designed for scientists, technicians on the shop floor, engineers, equipment manufacturers, and operational managers concerned with accurate and precise measurement whether in research, development, or manufacturing applications. Conference
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These issues are of increasing importance in a global marketplace for improving competitiveness and the interoperability and compatibility of manufactured goods.

Visit the NACMA Event Website
Visit our 2011 Workshop and Conference website for the latest information including how to register as a Attendee or as a Sponsor.
  Platinum Sponsor  
     
     
     
  Gold Sponsor  
     
  CTA  
     
  Nikon Metrology  
     
Silver Sponsor
     
  Mitutoyo Canada   
     
  Kotem  
     
  Creaform  
     
  Neptec  
     
  Zeiss  
     
  amrikart  
     
  NACMA Sponsor  
     
     
     

Registration Information:

Edward Yaris
Phone: (716) 535-0966
email: ed.yaris@gdt-consultants.com

Registration Form:
Attendee | Sponsors
CENAM NIST
IIGDT Kotem